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J.Health Sci., 45(3), 166-171, 1999
Trace Elemental Analysis of Illicit Methamphetamines Using Total Reflection X-Ray Fluorescence Spectroscopy[in Japanese]
Seiji Muratsu,ａ Sadao Fukui,ａ Toyonaga Maeda,ａ Tohru Matsushita,ａ Hiromu Hasegawa,ａ Yukihiro Sakurai,ａ Osamu Shimoda,ａ Sumio Kaizaki,ｂ and Toshio Ninomiyaａ
ａForensic Science Laboratory, Hyogo Prefectural Police Headquarters, 5-4-1 Shimoyamate-dori, Chuo-ku, Kobe 650-8510, Japan and ｂDepartment of Chemistry, Graduate School of Science, Osaka University, Machikaneyama 1-1, Toyonaka 560-0043, Japan
Total reflection X-ray fluorescence spectroscopy (TXRF) was applied to trace elemental analysis of 50 kinds of seized methamphetamines, a half of which had been classified to be pure and the remainder to be impure.
As trace elements, Br, Hg, I, Ca, Fe, Cr, Mn, Ni, Cu and Zn were detected.
Among them, Br was detected in all samples and its content was distributed between 0.4 ng and 71 ng per 1 mg of methamphetamine HCl and Hg was detected in 8 samples and its content was distributed between 0.8 ng and 9 ng per 1 mg of methamphetamine HCl.
Iodine was detected in 8 samples, among which 6 samples also contained Hg.
Hg and I were presumed to be derived from synthetic reagents.
Iron and other heavy metals would be derived from impurities in synthetic solvents or metal containers through synthetic or smuggling processes.
Elements detected in seized methamphetamines are applicable as tracing markers for the ascertainment of clandestine synthetic techniques or places to make illicit methamphetamine salts.
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